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| 2N4351 Linear Integrated Systems FEATURES DIRECT REPLACEMENT FOR INTERSIL 2N4351 HIGH DRAIN CURRENT HIGH GAIN ABSOLUTE MAXIMUM RATINGS @ 25 C (unless otherwise stated) Maximum Temperatures Storage Temperature Operating Junction Temperature Maximum Power Dissipation Continuous Power Dissipation Maximum Current Drain to Source Maximum Voltages Drain to Body Drain to Source Peak Gate to Source2 25V 25V 125V 100mA * Body tied to Case. 375mW -65 to +200 C -55 to +150 C 1 N-CHANNEL MOSFET ENHANCEMENT MODE ID = 100mA gfs = 1000S TO-72 BOTTOM VIEW G 2 3 D S 1 4 C ELECTRICAL CHARACTERISTICS @ 25 C (unless otherwise stated) (VSB = 0V unless otherwise stated) SYMBOL BVDSS VDS(on) VGS(th) IGSS IDSS ID(on) gfs rDS(on) Crss Ciss Cdb CHARACTERISTIC Drain to Source Breakdown Voltage Drain to Source "On" Voltage Gate to Source Threshold Voltage Gate Leakage Current Drain Leakage Current "Off" Drain Current "On" Forward Transconductance Drain to Source "On" Resistance Reverse Transfer Capacitance Input Capacitance Drain to Body Capacitance 3 1000 300 1.3 5.0 5.0 pF 1 MIN 25 1 5 10 10 pA nA mA S V TYP MAX UNITS CONDITIONS ID = 10A, VGS = 0V ID = 2mA, VGS = 10V VDS = 10V, ID = 10A VGS = 30V, VDS = 0V VDS = 10V, VGS = 0V VGS = 10V, VDS = 10V VDS = 10V, ID = 2mA, f = 1MHz VGS = 10V, ID = 0A, f = 1kHz VDS = 0V, VGS = 0V, f = 140kHz VDS = 10V, VGS = 0V, f = 140kHz VDB = 10V, f = 140kHz Linear Integrated Systems * 4042 Clipper Court * Fremont, CA 94538 * Tel: 510 490-9160 * Fax: 510 353-0261 SWITCHING CHARACTERISTICS SYMBOL td(on) tr td(off) tf CHARACTERISTIC Turn On Delay Time Turn On Rise Time Turn Off Delay Time Turn Off Fall Time MAX 45 65 60 100 ns UNITS SWITCHING TEST CIRCUIT VDD TIMING WAVEFORMS 10 s +10 V VIN VOUT 90% 50% 10% tr = tf < 2 ns Duty Cycle 2% SET VDS = 10V 8.21k 0V +10 V VDS 0V 4.5k VIN 51 td(on) 90% 50% 10% td(off) tr tf TO-72 Four Lead 0.195 DIA. 0.175 0.030 MAX. 0.230 DIA. 0.209 0.150 0.115 4 LEADS 0.019 DIA. 0.016 0.100 0.500 MIN. 0.050 2 1 3 4 45 0.046 0.036 0.048 0.028 1. 2. Absolute maximum ratings are limiting values above which serviceability may be impaired. Device must not be tested at 125V more than once or longer than 300ms. Information furnished by Linear Integrated Systems is believed to be accurate and reliable. However, no responsibility is assumed for its use; nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Linear Integrated Systems. Linear Integrated Systems * 4042 Clipper Court * Fremont, CA 94538 * Tel: 510 490-9160 * Fax: 510 353-0261 |
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